Reference

mail15.gif (343 bytes)

Technical Article Resources                book4.gif (10685 bytes)                       

PDF format documents require Acrobat Reader.  getacro.gif (1692 bytes)

redbt.gif (2792 bytes)

Detecting Die Surface Delamination, from the June 2002 COTS Journal.  Copyright 2002 RTC Group.  Used by permission.

redbt.gif (2792 bytes)

Click here for a case study of an EEPROM bit loss failure that is delamination-related (pdf format).  Copyright 2002 DM Data.  Used by permission.  For details or for newsletter info call DM Data at 480-451-7449.

redbt.gif (2792 bytes)

Click here for a current article in CIRCUITS ASSEMBLY about moisture sensitive devices.

redbt.gif (2792 bytes)

Flip Chip Defect Detection ,published in Advanced Packaging magazine, March 2002. (pdf format).   Copyright 2002 by PennWell Corp.   E-mail us if you would like a reprint.

redbt.gif (2792 bytes)

  A Case Study of PEMs Susceptible to Die Surface Delamination... (pdf format)

redbt.gif (2792 bytes)

Acoustic MicroImaging in Electronics, Future Circuits, March 1999 (pdf format)  Note:   "C-SAM" is a registered trademark of Sonoscan, Inc.

redbt.gif (2792 bytes)

Step-By-Step: Die Attach, March 1999 (pdf format)

Reprinted with the permission of 'Advanced Packaging' magazine. Copyright 1999 by IHS Publishing Group. All rights reserved.

redbt.gif (2792 bytes)


Acoustic Microimaging helps assure reliability of plastic COTS parts (from Nov 99 Military & Aerospace Electronics), copyright 1999 PennWell Publishing. Used by permission

redbt.gif (2792 bytes)

Acoustic Microscopy of Tightly Closed Delaminations in Multilayer Ceramic Chip Capacitors, Copyright 1999, AcousTech Inc. (pdf format)

redbt.gif (2792 bytes)

Curious about how acoustic microimaging compares to x-ray?  Click here for an informative article (Word format), originally published as a case study in Semiconductor Reliability News, March 2000.  (E-mail us for more information about this newsletter.)  Copyright 2000 AcousTech Inc.

redbt.gif (2792 bytes)

Evaluation of an Automotive Fluid Line Assembly Using Acoustic Microimaging  Originally presented at IAMIS 2000 (October 2000).  Copyright 2000 AcousTech Inc. (pdf format)

redbt.gif (2792 bytes)

A useful specification is IPC/JEDEC J-STD-035, "Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components". To download it free (you will be required to register and create a login name), click here and go to the free standards.
 

Contact AcousTech, Inc.
Fort Wayne, IN
(260) 637-2167
email.gif (2031 bytes)

 

Info.gif (986 bytes)Examples.gif (1017 bytes)Staff.gif (992 bytes)CustCom.gif (1089 bytes)

 
















AcousTech Inc. is a testing laboratory providing C-SAM acoustic microimaging or acoustic imaging, x-ray,
and other failure analysis related services. C-SAM or SAM acoustic microimaging or acoustic imaging, or scanning
acoustic microscopy, is a useful failure analysis tool involving nondestructive testing. Acoustic microimaging
or acoustic imaging or scanning acoustic microscopy is sometimes called Sonoscan testing, because Sonoscan
is a well-known equipment manufacturer of C-SAM acoustic imaging equipment. Sonoscan and Sonix both make
acoustic microimaging or acoustic imaging nondestructive testing equipment. Sonoscan and Sonix use other
names for acoustic microimaging or acoustic imaging, like C-SAM, SAM, Dr. SAM, TAMI, and FACTS. Names like
Dr. SAM, TAMI, and FACTS are registered trademarks of their respective companies. Failure analysis scanning
professionals depend on C-SAM or CSAM acoustic micro acoustic imaging much as they do x-ray or radiographic
analysis. AcousTech Inc. provides C-SAM acoustic microimaging or acoustic imaging as a service. We do not
sell equipment like Sonoscan or Sonix.

CSam C Sam Sonix scanning Sonoscan acoustic imaging microimaging nondestructive testing microscopy Sonoscan testing Sam Dr Sam Tami Facts Acoustech x ray x-ray C Sam CSam C-Sam Dr Sam Sonoscan Sonix acoustic imaging xray x-ray x ray.

Applications for C-SAM acoustic micro imaging include cracked plastic ICs, or PEMs, and also MEMS applications such as silicon/silicon bonded wafers, and glass/silicon bonded wafers. This technique offers much better resolution than traditional IR testing scanning.

AcousTech Inc. is a testing laboratory providing C-SAM acoustic microimaging or acoustic imaging, x-ray,
and other failure analysis related services. C-SAM or SAM acoustic microimaging or acoustic imaging, or
acoustic microscopy, is a useful failure analysis tool involving nondestructive testing. Acoustic microimaging
or acoustic imaging or scanning acoustic microscopy is sometimes called Sonoscan testing, because scanning Sonoscan
is a well-known equipment manufacturer of C-SAM acoustic imaging equipment. Sonoscan and Sonix both make
acoustic microimaging or acoustic imaging nondestructive testing equipment. Sonoscan and Sonix use other
names for acoustic microimaging or acoustic imaging, like C-SAM, SAM, Dr. SAM, TAMI, and FACTS. Names like
Dr. SAM, TAMI, and FACTS are registered trademarks of their respective companies. Failure analysis
professionals depend on C-SAM or CSAM acoustic micro acoustic imaging much as they do x-ray or radiographic
analysis. AcousTech Inc. provides C-SAM acoustic microimaging or acoustic imaging as a service. We do not
sell equipment like Sonoscan or scanning Sonix.

CSam C Sam Sonix Sonoscan acoustic imaging microimaging nondestructive testing microscopy Sonoscan testing Sam Dr Sam Tami Facts Acoustech x ray x-ray C Sam CSam C-Sam Dr Sam Sonoscan Sonix acoustic imaging xray x-ray x ray.

Applications for C-SAM scanning acoustic micro imaging include cracked plastic ICs, or PEMs, and also MEMS applications such as silicon/silicon bonded wafers, and glass/silicon bonded wafers. This technique offers much better resolution than traditional IR testing scanning.

AcousTech Inc. is a testing laboratory providing C-SAM acoustic microimaging or acoustic imaging, x-ray,
and other failure analysis related services. C-SAM or SAM acoustic microimaging or acoustic imaging, or scanning
acoustic microscopy, is a useful failure analysis tool involving nondestructive testing. Acoustic microimaging
or acoustic imaging or scanning acoustic microscopy is sometimes called Sonoscan testing, because Sonoscan
is a well-known equipment manufacturer of C-SAM acoustic imaging equipment. Sonoscan and Sonix both make
acoustic microimaging or acoustic imaging nondestructive testing equipment. Sonoscan and Sonix use other
names for acoustic microimaging or acoustic imaging, like C-SAM, SAM, Dr. SAM, TAMI, and FACTS. Names like
Dr. SAM, TAMI, and FACTS are registered trademarks of their respective companies. Failure analysis scanning
professionals depend on C-SAM or CSAM acoustic micro acoustic imaging much as they do x-ray or radiographic
analysis. AcousTech Inc. provides C-SAM acoustic microimaging or acoustic imaging as a service. We do not
sell equipment like Sonoscan or Sonix.

CSam C Sam Sonix scanning Sonoscan acoustic imaging microimaging nondestructive testing microscopy Sonoscan testing Sam Dr Sam Tami Facts Acoustech x ray x-ray C Sam CSam C-Sam Dr Sam Sonoscan Sonix acoustic imaging xray x-ray x ray.

Applications for C-SAM acoustic micro imaging include cracked plastic ICs, or PEMs, and also MEMS applications such as silicon/silicon bonded wafers, and glass/silicon bonded wafers. This technique offers much better resolution than traditional IR testing scanning.

AcousTech Inc. is a testing laboratory providing C-SAM acoustic microimaging or acoustic imaging, x-ray,
and other failure analysis related services. C-SAM or SAM acoustic microimaging or acoustic imaging, or
acoustic microscopy, is a useful failure analysis tool involving nondestructive testing. Acoustic microimaging
or acoustic imaging or scanning acoustic microscopy is sometimes called Sonoscan testing, because scanning Sonoscan
is a well-known equipment manufacturer of C-SAM acoustic imaging equipment. Sonoscan and Sonix both make
acoustic microimaging or acoustic imaging nondestructive testing equipment. Sonoscan and Sonix use other
names for acoustic microimaging or acoustic imaging, like C-SAM, SAM, Dr. SAM, TAMI, and FACTS. Names like
Dr. SAM, TAMI, and FACTS are registered trademarks of their respective companies. Failure analysis
professionals depend on C-SAM or CSAM acoustic micro acoustic imaging much as they do x-ray or radiographic
analysis. AcousTech Inc. provides C-SAM acoustic microimaging or acoustic imaging as a service. We do not
sell equipment like Sonoscan or scanning Sonix.

CSam C Sam Sonix Sonoscan acoustic imaging microimaging nondestructive testing microscopy Sonoscan testing Sam Dr Sam Tami Facts Acoustech x ray x-ray C Sam CSam C-Sam Dr Sam Sonoscan Sonix acoustic imaging xray x-ray x ray.

Applications for C-SAM scanning acoustic micro imaging include cracked plastic ICs, or PEMs, and also MEMS applications such as silicon/silicon bonded wafers, and glass/silicon bonded wafers. This technique offers much better resolution than traditional IR testing scanning.

AcousTech Inc. is a testing laboratory providing C-SAM acoustic microimaging or acoustic imaging, x-ray,
and other failure analysis related services. C-SAM or SAM acoustic microimaging or acoustic imaging, or scanning
acoustic microscopy, is a useful failure analysis tool involving nondestructive testing. Acoustic microimaging
or acoustic imaging or scanning acoustic microscopy is sometimes called Sonoscan testing, because Sonoscan
is a well-known equipment manufacturer of C-SAM acoustic imaging equipment. Sonoscan and Sonix both make
acoustic microimaging or acoustic imaging nondestructive testing equipment. Sonoscan and Sonix use other
names for acoustic microimaging or acoustic imaging, like C-SAM, SAM, Dr. SAM, TAMI, and FACTS. Names like
Dr. SAM, TAMI, and FACTS are registered trademarks of their respective companies. Failure analysis scanning
professionals depend on C-SAM or CSAM acoustic micro acoustic imaging much as they do x-ray or radiographic
analysis. AcousTech Inc. provides C-SAM acoustic microimaging or acoustic imaging as a service. We do not
sell equipment like Sonoscan or Sonix.

CSam C Sam Sonix scanning Sonoscan acoustic imaging microimaging nondestructive testing microscopy Sonoscan testing Sam Dr Sam Tami Facts Acoustech x ray x-ray C Sam CSam C-Sam Dr Sam Sonoscan Sonix acoustic imaging xray x-ray x ray.

Applications for C-SAM acoustic micro imaging include cracked plastic ICs, or PEMs, and also MEMS applications such as silicon/silicon bonded wafers, and glass/silicon bonded wafers. This technique offers much better resolution than traditional IR testing scanning.

AcousTech Inc. is a testing laboratory providing C-SAM acoustic microimaging or acoustic imaging, x-ray,
and other failure analysis related services. C-SAM or SAM acoustic microimaging or acoustic imaging, or
acoustic microscopy, is a useful failure analysis tool involving nondestructive testing. Acoustic microimaging
or acoustic imaging or scanning acoustic microscopy is sometimes called Sonoscan testing, because scanning Sonoscan
is a well-known equipment manufacturer of C-SAM acoustic imaging equipment. Sonoscan and Sonix both make
acoustic microimaging or acoustic imaging nondestructive testing equipment. Sonoscan and Sonix use other
names for acoustic microimaging or acoustic imaging, like C-SAM, SAM, Dr. SAM, TAMI, and FACTS. Names like
Dr. SAM, TAMI, and FACTS are registered trademarks of their respective companies. Failure analysis
professionals depend on C-SAM or CSAM acoustic micro acoustic imaging much as they do x-ray or radiographic
analysis. AcousTech Inc. provides C-SAM acoustic microimaging or acoustic imaging as a service. We do not
sell equipment like Sonoscan or scanning Sonix.

CSam C Sam Sonix Sonoscan acoustic imaging microimaging nondestructive testing microscopy Sonoscan testing Sam Dr Sam Tami Facts Acoustech x ray x-ray C Sam CSam C-Sam Dr Sam Sonoscan Sonix acoustic imaging xray x-ray x ray.

Applications for C-SAM scanning acoustic micro imaging include cracked plastic ICs, or PEMs, and also MEMS applications such as silicon/silicon bonded wafers, and glass/silicon bonded wafers. This technique offers much better resolution than traditional IR testing scanning.