Collecting
and analyzing data to determine why a microelectronic part or device failed is
done by all industries we serve at
AcousTech. With careful Failure Analysis, manufacturers gain knowledge that’s essential
to the development of new electronic products and the improvement of those
already on the market.
AcousTech
takes failed components collected by our clients and examines them primarily using
C-SAM®,
X-Ray, or some combination thereof to
determine the cause or causes of failure.
Either
process – C-SAM® or X-Ray – may be used as the first step in
nondestructively identifying a host of potential problems. Both, for instance,
are useful in examining the condition of a microelectronic device before it’s
desoldered from a board, which can alter its condition. Beyond that, C-SAM®
excels in exposing die surface delamination, leadframe delamination,
delamination at a wirebond, and cracks. X-Ray inspection is especially good at
finding lifted or shorted wire bonds, excessive die-attach voiding, extraneous
material, excessive die-attach material, and chipped die edges.
Every
type of microelectronic part or device is prone to failure and thus a potential
candidate for Failure Analysis. Typically submitted to us are…
- PEMs
(plastic encapsulated microcircuits) such as SSOPs, SOICs, PLCCs, MSOPs,
PQFPs/TQFPs, CDIPs/PDIPs, BGAs/FBGAs, and SOTs,
- devices
on PCBs (printed circuit boards),
- hybrid
devices,
- flip
chips,
- medical implants, and
- automotive sensors.
The C-SAM®
standards that apply are…
The standards that apply to X-Ray inspection are…
Our
Failure Analysis services also entail providing you with…
- a quick turnaround,
- a detailed yet concise pass/fail
report that notes all defects discovered,
- a certificate of conformance, and
- a CD that includes all images
taken during the tests and/or the original X-Ray films.
Beyond
that, we offer you the same professional collaboration and competitive pricing
that complete the benefits of partnership we extend to every AcousTech client.
Questions?
Contact AcousTech. We’ll be happy to
explain more about how our services can be applied to your Failure Analysis
needs. And when you’re ready, be sure to Request a
Quote.
C-SAM® is a registered trademark of Sonoscan, Inc.