Scanning Acoustic Microscopy has proven invaluable as a non-invasive,
non-destructive tool for detecting flaws in microelectronic parts and
assemblies. Because it’s particularly sensitive to defects such as
delamination, voids, and cracks, many industry standards require that C-SAM®
be used as part of a larger inspection process. Quite often, it’s accompanied
can be beneficial in a variety of applications. At AcousTech, we
specialize in using it for …
The primary standard for C-SAM® use is
J-STD-035. This is a basic functioning/processing standard specifying what
scans can be performed and interfaces evaluated. Everything we do at AcousTech
follows this standard. It should be noted, though, that J-STD-035 does not set
forth Pass/Fail criteria for devices.
Other C-SAM® standards we follow at
AcousTech include but are not limited to:
contract with AcousTech for C-SAM® services, we provide both
in-depth analysis and concise but thorough reporting. You can count on us for
personalized service, a truly collaborative partnership, and fast turnaround as
questions about C-SAM® and its applications? We’ll be happy to
answer them. Simply contact AcousTech. If
you’re already familiar with C-SAM® and have a pressing need for one
or more of its applications, Request a Quote
from us today.
C-SAM® is a registered
trademark of Sonoscan, Inc.