At
AcousTech, we’ve established a niche specializing in three methods of
microelectronic component and assembly inspection:
- state-of-the-art C-mode scanning
acoustic micro-imaging (or microscopy), commonly known as C-SAM®;
- X-Ray, which often is used as a complement to C-SAM® and other
inspection techniques; and
- Visual inspection accomplished with a stereo microscope and, again, used in
conjunction with other techniques.
Many industries rely on our inspection services and
have a wide range of applications for
them, all of which we are well experienced in fulfilling.
Our
inspection services include thorough analysis and detailed yet concise
reporting of every issue we find in the course of our reviews. To make sure we
fully understand your needs, we consult with you when you first engage us. Then
we draw up our plan of attack and communicate with you clearly – up front –
just what that plan entails. We prefer to partner with our clients every step
of the way. To that end, we openly share our methods with you, collaborate with
you, and deliver reports that provide you with full documentation, including photos.
Everything we do is customized to address your specific concerns and see to it
that your inspection objectives are met.
You can
learn more about our microelectronic inspection services by reviewing the pages
to which we link above. If you have questions, contact
AcousTech. We make it easy for you to Request
a Quote, too. Try our inspection services once, and we’re confident
you’ll make us your preferred provider – a partner you can rely on time and
again.
C-SAM® is a registered trademark of Sonoscan, Inc.