Many applications benefit from the use of X-Ray to
inspect microelectronic parts and components. It’s used most commonly, though,
for lot screening and counterfeit detection, where it’s particularly cost
effective. Quite often, X-Ray inspection is used in conjunction
with acoustic microscopy and visual inspection.
It well complements C-SAM® because X-Ray inspection excels in its
ability to reveal…
- wire bonding issues, such as
wires that touch and wires that are lifted or bent, and
- inconsistent lot constructions, such
as differences in die size and different wire bonding patterns.
inspection services have found favor with a number of industries, among them the aerospace industry,
the military, test laboratories, medical device manufacturers, and the
automotive and semiconductor industries as well as various electronic component
professionals can advise you on the best application for X-Ray inspection,
including its use as a complementary technique. Whatever your needs, we’ll
customize a test plan to accommodate them. We’ll also communicate our
procedures to you clearly so you know what to expect.
Contact AcousTech. And be sure to Request a Quote.
C-SAM® is a registered trademark of